Tevet Process Control Technologies, an innovator of integrated metrology solutions for film thickness measurement of semiconductor devices, today announced that after a collaborative evaluation of its IsTMS measurement product by both Novellus Systems (Nasdaq:NVLS - News) and by a Novellus customer, Tevet has received an approved supplier designation from Novellus. Following evaluation and testing by Novellus, the IsTMS has become a tool of record in a production fab facility. "Tevet's system architecture, unique measurement capabilities, and performance, combined with Novellus' smart and friendly interfaces, allowed for a seamless integration and qualification in a production environment," said Yuval Wasserman, President and CEO of Tevet. "As a result, we have received multiple follow-on orders for production applications integrated on Novellus 300mm systems."

"Unlike other integrated metrology solutions, the IsTMS has no moving parts. The system performs measurements directly on product wafers and is seamlessly integrated onto single-wafer production tools with no impact on the tools' productivity," added Wasserman.

About Tevet-PCT: Tevet Process Control Technologies provides the semiconductor processing industry innovative integrated metrology solutions for improved process control technologies. Tevet's In-situ Thickness Measurement System, IsTMS, offers a robust, highly accurate and affordable measurement tool that seamlessly integrates into all manufacturing platforms for thin film applications. Tevet's large spot size broad band spectral reflectometry combined with proprietary algorithms make the IsTMS a perfect candidate for integrated or in-situ metrology. Supporting customers around the world, Tevet develops its technology and products in its R&D center in Israel and provides sales, marketing and technical support through its US office in Pleasanton, Calif.